A functional testing of analogue electronic circuits with the use of specification approximation in the time-domain response features space

Piotr Jantos; Tomasz Golonek; Jerzy Rutkowski

A functional testing of analogue electronic circuits with the use of specification approximation in the time-domain response features space

Piotr Jantos
, Tomasz Golonek
, Jerzy Rutkowski

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Silesian University of Technology

Research output: Contribution to journal › Article › peer-review

Abstract

This paper presents a method for specification driven testing of analogue electronic circuits. The method is based on utilisation of tested circuit response features to a test stimulus. Delaunay's triangulation is employed for the purpose of finding tested circuit specifications values in spaces defined with response features. Specification maps are used for the purpose of estimating the tested circuits performance quality. A neural network classifier has been utilised to make a decision whether the circuit is fully functional.

Translated title of the contribution	Testowanie funkcjonalne analogowych układów elektronicznych z wykorzystaniem aproksymacji specyfikacji w przestrzeni cech odpowiedzi układu testowanego
Original language	English
Pages (from-to)	110-113
Number of pages	4
Journal	Przeglad Elektrotechniczny
Volume	87
Issue number	10
Publication status	Published - 2011

Keywords

Analogue electronic circuits
Delaunay's triangulation
Neural classifier
Specification driven test

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

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AB - This paper presents a method for specification driven testing of analogue electronic circuits. The method is based on utilisation of tested circuit response features to a test stimulus. Delaunay's triangulation is employed for the purpose of finding tested circuit specifications values in spaces defined with response features. Specification maps are used for the purpose of estimating the tested circuits performance quality. A neural network classifier has been utilised to make a decision whether the circuit is fully functional.

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A functional testing of analogue electronic circuits with the use of specification approximation in the time-domain response features space

Abstract

Keywords

ASJC Scopus subject areas

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